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Mots clés
Thin films
Sputtering
8140Ef
Silicon Carbide
Evaluation
2H
GaMnAs
Photoluminescence
Silicon carbide
Aluminum
17O
Metal-insulator transition
Ageing
Kossel diffraction
7630Lh
Adsorbed layers
Epitaxial growth
RBS
Transparent conductive oxide TCO
Adsorption Isotherms
Gold
Acoustic
Zinc oxide
ALD
18O resonance
Magnetic semiconductors
Oxidation
13C
Growth
Indium oxide
AFM
Nuclear resonance profiling NRP
Passivation
Epitaxy
18O
27Ald p&α
Interface defects
Atomic Layer Deposition ALD
Hysteresis
XRD
Multilayer
17Op
7550Ee
ADSORPTION DESORPTION HYSTERESIS
AC susceptibility
Aluminium
Magnetization curves
Ferromagnetic resonance
27Aldp
Acoustic propreties of solid
Topological defects
Isotopic Tracing
Raman spectroscopy
Nitridation
Ion beam analysis
15N
Pulsed laser deposition
Rutherford backscattering spectrometry RBS
6855Jk
NRP
Measurement
Adsorption
Auger electron spectroscopy AES
7550Pp
Nuclear reaction analysis
17Opp
Al2O3
Low energy electron diffraction LEED
HfO2
Thin film
Silica
Periodic multilayer
Pb centers
3C-SiC
Channeling
X-ray diffraction
Density functional theory
Topological insulators
Nanostructures
XPS
Nanoparticles
Alloy
PIXE
Stable isotopic tracing
EPR
Defects
Alloys
Nickel
SiC
Energy loss
Annealing
27Alda
Magnetic anisotropy
Capillary condensation
Silicon
Charge exchange
Ion implantation
Gallium oxide
Oxygen deficiency
Diffusion