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Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2011

In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations

Résumé

A method and the corresponding platform devoted to operational SEE-rate prediction are presented and illustrated by experimental results. Predicted error-rates are in well agreement with results issued from the activation of an SRAM platform, in 90 nm technology node, on board stratospheric balloons flights. Direct ionization of protons is investigated for a 65 SRAM memory virtually boarded on the balloon flight.
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Dates et versions

hal-00672424 , version 1 (21-02-2012)

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L. Artola, Raoul Velazco, G. Hubert, S. Duzellier, T. Nuns, et al.. In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations. IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2644 - 2651. ⟨10.1109/TNS.2011.2172220⟩. ⟨hal-00672424⟩
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